Minutes, IBIS Quality Committee

09 February 2010

11-12 AM EST (8-9 AM PST)

ROLL CALL
  Adam Tambone
* Anders Ekholm, Ericsson
  Barry Katz, SiSoft
  Benny Lazer
  Benjamin P Silva
  Bob Cox, Micron
* Bob Ross, Teraspeed Consulting Group
  Brian Arsenault
  David Banas, Xilinx
* Eckhard Lenski, Nokia Siemens Networks
  Eric Brock
  Guan Tao, Huawei Technologies
  Gregory R Edlund
  Hazem Hegazy
  Huang Chunxing, Huawei Technologies
  John Figueroa
  John Angulo, Mentor Graphics
  Katja Koller, Nokia Siemens Networks
  Kevin Fisher
  Kim Helliwell, LSI Logic
  Lance Wang, IOMethodology
  Lijun, Huawei
  Lynne Green, Green Streak Programs
* Mike LaBonte, Cisco Systems
  Mike Mayer, SiSoft
* Moshiul Haque, Micron Technology
  Muniswarareddy Vorugu, ARM Ltd
* Pavani Jella, TI
  Peter LaFlamme
  Randy Wolff, Micron Technology
  Radovan Vuletic, Qimonda
  Robert Haller, Enterasys
  Roy Leventhal, Leventhal Design & Communications
  Sherif Hammad, Mentor Graphics
  Tim Coyle, Signal Consulting Group
  Todd Westerhoff, SiSoft
  Tom Dagostino, Teraspeed Consulting Group
  Kazuyoshi Shoji, Hitachi
  Sadahiro Nonoyama

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.

Call for opens and patent disclosures:

- No one declared a patent.

- Anders: We should look at Bruce Archambeault correlation work
  - FSV
  - Maybe it could go on the IQ website somehow
  - IEEE copyright, not freely available

AR Review:

- Mike start correlation handbook outline
  - Pavani helped

- Mike add MS 2003 format files to IQ checklist upload
  - Done

New items:

Mike showed a starter outline for a correlation handbook
- Pavani and Mike created this last week
- Bob: Pre-emphasis is more general than differential
  - Also true differential doesn't relate much to IBIS
- Anders: External models can do it

Mike showed IEEE draft FSV document from Bruce Archambeault
- Bob: Our document might include system correlation per Huawei
- Mike: We need a language to send reference measurements to model makers
  - Golden waveforms can send from IC makers to end users
  - We need a more extensive interconnect language for systems
  - Then reference measurements could be sent to IC makers
- Bob: It's not the IC maker's job to debug your design
- Mike: They probably would be interested
- Mike: Section 7 discusses FSV
  - It seems to define a score
- Bob: We still need to look at David Banas' presentation
  - Yuri Schlepnev also provided percent metrics
  - We discussed tests for passivity and causality in Touchstone
  - Yuri has done that
- Mike: Dimensionless scores can be helpful
  - But they don't help predict timing analysis errors
  - Also errors can be frequency related
- Bob: Every method has it's good and bad points
  - This IEEE document might be a good normative reference
- Mike: Has there been any work on this since June 2008?
- Bob: Bruce may be interested in pursuing this
  - Sometimes public access is granted to these documents

AR: Anders contact Bruce Archambeault about IEEE P1597.1 and IQ participation

Discussion of summit:
- Bob: Randy gave a good checklist presentation
  - Arpad asked if summary scoring could be automated
  - The variable number of sheets is the issue for that
  - MS Excel has limitations in what it can do across sheets
- Bob: Lynne talked about model review

AR: Mike post link to Randy and Moshiul's presentation

Next meeting will be Feb 16

Meeting ended at 12:05 PM Eastern Time.
